Equipment for irradiation of electronic components and systems: sample holder, possibilities, beams in terms of LET and range.
The GANIL is also a facility for the testing of electronic devices under heavy ions radiation, in a wide range of energy. SEE testing is possible with ions as Kr, Xe, Pb … in a wide LET range (16 to 96 MeV.cm²/mg).
|With the aim of irradiating electronic components and systems, the cave G4 is equipped with a sample holder. The irradiation occurs in the air; a stainless steel window (10 µm) separates the vacuum from the air.|
The electronic cards are fixed on the sample holder, and can be easily moved in the three directions (x, y and z) so that the target component receives the beam. The conception of the device allows to change the components quickly and surely.
|A red laser system indicates the center of the beam. A tilt possibility is also furnished (0 to 90°).
The LET calculation can be made with TRIM, taking into account the 10 µm of the stainless steel window and the air distance.
For a given ion beam, a LET adjustment is possible by:
Some samples can be done on demand (please contact us).